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In the face of a complex process, you need equipment that can directly detect and quickly correct shortcomings in the process
JET 3000 can meet your needs, simple and intuitive inspection process Quickly do a large number of inspections for your products, and leave a complete production inspection history for your products
● TestJet Plus technology provide higher BGA testingcapacity of test coverage compare to conventionaltestJet.
● Resistance Measurement 0.10Ω.~40MΩ.
● Capacitance Measurement 1pF~300mF
● Inductance Measurement 1uH~ 250H.
● Diode Measurement 0.01V~ 60V.
● Transistor Measurement 0.01V~10V.
● lC Measurement Clamping Diode Default Setting1.2V(Adjustable by test program)
● Voltage Measurement -80V~ +80V.
A Complete In-Circuit-Test System
Multi-core
Analog Test
Digital Test
On board programming
Boundary scan
Connection scan
Functional test
Equipped with UF680 function module
● Press type design, provide offline operation mode
● Use unique PClE data processing, faster test speed
● Dual-core or quad-core testing can be used, and the testspeed can be 1~3 times increase
● Power-on test technology can be used
● Can use Test Jet test technology
● Automatic learning for large capacitors, automaticdischarge function before and after testing
● Power-on test and digital test function can be perfommedBoundary Scan test technology can be used
● Can use online burning or external burning technology
Open circuit/short circuit test part test | |||
OPENISHORT | Short-circuit learning threshold | 0~100Ω | |
Open-circuitlearning threshold | 0~100Ω | ||
CV Mode | Measuing range | 1Ω~40Ω | |
AC Mode | Measuing range | 1pF~300uF | |
PhaseMode(P Mode) | Measuing range | 1pF~30uF | |
Maximum number | Maximum number oftest points | 4608 Point | |
AC Mode | Measuing range | 1uH ~ 30H | |
Phase Mode (P Mode) | Measuing range | 1uH~30H | |
Diode | Measuing range | 0.01V~60V | |
Tansistor | Measuing range | 0.01V~10V | |
ILIKELEO
Leopeng_keentec
sales@1clicksmt.com